The question by parametric models of partial failures in technical devices
Abstract
The question by parametric models of partial failures in technical devices
Incoming article date: 21.05.2019The authors consider the issue of assessing partial failure in the technical system from the standpoint of parametric reliability. Evaluation of failure behavior is carried out according to such parameters as time between hours to failure and the achievement of goals, risks. Under the risk in this paper refers to the likelihood of a subsequent failure (full or partial) or the transition occurred in full. The authors propose to expand the range of parameters that characterize hitting a failure state by adding characteristics of possible degradation processes and values of destructive environmental factors in the predicted period of continued operation of the object under study. Also, special attention is paid to the fact that the likelihood of partial failure is influenced by factors that can be divided into external and internal, while the internal ones may depend on external ones. Ishikawa diagram shows the dependence of the rate of degradation of the PR on various factors.
Keywords: partial failure, parametric reliability, risk, time of failure degradation, Ishikawa diagram